Biblioteca
Catálogo Bibliográfico
JAERI-Research 026 2004
Zukeran, A.
Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis. -- [s.l.] : JAERI, 2005. -- Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis / Zukeran, A.; 026 2004
I. JAPAN ATOMIC ENERGY RESEARCH INSTITUTE
(2) Inv.: 210682 S.T.: JAERI-Research 026 2004
Zukeran, A.
Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis. -- [s.l.] : JAERI, 2005. -- Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis / Zukeran, A.; 026 2004
I. JAPAN ATOMIC ENERGY RESEARCH INSTITUTE
(2) Inv.: 210682 S.T.: JAERI-Research 026 2004
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Zukeran, A.
Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis. -- [s.l.] : JAERI, 2005. -- Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis / Zukeran, A.; 026 2004
I. JAPAN ATOMIC ENERGY RESEARCH INSTITUTE
(2) Inv.: 210682 S.T.: JAERI-Research 026 2004
Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis. -- [s.l.] : JAERI, 2005. -- Criticality and Doppler Reactivity Worth Uncertainty due toResolved Resonance Parameter errors-formula for sensitivity analysis / Zukeran, A.; 026 2004
I. JAPAN ATOMIC ENERGY RESEARCH INSTITUTE
(2) Inv.: 210682 S.T.: JAERI-Research 026 2004