Biblioteca
Catálogo Bibliográfico
Kim, I. S.
QUANTITATIVE EVALUATION OF SURVEILLANCE TEST INTERVALS INCLUDING TEST-CAUSED RISK.. -- [s.l.] : , Feb 92
I. Samanta, P. K.
QUANTITATIVE EVALUATION OF SURVEILLANCE TEST INTERVALS INCLUDING TEST-CAUSED RISK.. -- [s.l.] : , Feb 92
I. Samanta, P. K.
Para contactarnos:
biblioteca@arn.gob.ar
Centro Atómico Ezeiza: (+5411) 4125-8826/8481
Sede Central: (+5411) 6323-1528
Pérgamo OPAC Web
Formulario para Solicitud de Material
Kim, I. S.
QUANTITATIVE EVALUATION OF SURVEILLANCE TEST INTERVALS INCLUDING TEST-CAUSED RISK. -- [s.l.] : , Feb 92
I. Samanta, P. K.
QUANTITATIVE EVALUATION OF SURVEILLANCE TEST INTERVALS INCLUDING TEST-CAUSED RISK. -- [s.l.] : , Feb 92
I. Samanta, P. K.